Faculty

		Department	Research Interests
	Charles Ahn charles.ahn@yale.edu Website	Applied Physics, Mechanical Engineering and Materials Science, and Physics	Multifunctional oxides; scanning probe microscopies; complex order parameters in correlated oxides; onvolatile logic switches for post-CMOS computing paradigms
	Sohrab Ismail-Beigi sohrab.ismail-beigi@yale.edu Website	Applied Physics, Physics, and Mechanical Engineering and Materials Science	Ab-initio electronic structure methods; Transition metal oxides; Nanowires and nanotubes; Organic/inorganic interfaces
	Smita Krishnaswamy smita.krishnaswamy@yale.edu Website	Genetics and Computer Science	Machine learning; deep learning; data geometry and topology; analysis of big biomedical datasets
	Corey O'Hern corey.ohern@yale.edu Website	Mechanical Engineering and Materials Science	Soft matter and biological physics; glass and jamming transitions; protein folding and aggregation; structure and mechanical properties of cells and tissues
	Diana Qiu diana.qiu@yale.edu Website	Mechanical Engineering and Materials Science	Highly-tunable,and transient materials; exciton transport and coherence and nonlinear and ultrafast optical response in materials; Two-dimensional materials and heterostructures, material defects, hybrid perovskite, and topological materials
	Jan Schroers jan.schroers@yale.edu Website	Mechanical Engineering and Materials Science	Micro & Nano Replication, MEMS Materials & Processes, Amorphous Metallic Foams, Bulk Metallic Glasses, Bio-Medical Applications, Net-shaping processing Methods incorporating a wide range of length scales, Thermo Plastic Forming
	Udo Schwarz udo.schwarz@yale.edu Website	Mechanical Engineering and Materials Science and Chemical and Environmental Engineering	Local measurement of atomic-scale interactions and properties, including mechanical, electrical, and chemical interactions, to study materials science problems in surface physics and chemistry
	Cong Su cong.su@yale.edu Website	Mechanical Engineering and Materials Science	Transmission electron microscopy; atom control; substitutional doping; surface modification; ultralow contact resistence